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Modeling solar extreme ultraviolet irradiance variability using emission measure distributions
Author(s) -
Warren H. P.,
Mariska J. T.,
Lean J.,
Marquette W.,
Johannesson A.
Publication year - 1996
Publication title -
geophysical research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.007
H-Index - 273
eISSN - 1944-8007
pISSN - 0094-8276
DOI - 10.1029/96gl01481
Subject(s) - irradiance , solar irradiance , extreme ultraviolet lithography , extreme ultraviolet , chromosphere , solar maximum , physics , environmental science , solar physics , ultraviolet , wavelength , atmospheric sciences , line (geometry) , remote sensing , solar cycle , computational physics , astrophysics , optics , spectral line , astronomy , geology , solar wind , plasma , mathematics , laser , geometry , quantum mechanics
We introduce a new model of solar irradiance variability at extreme ultraviolet (EUV) wavelengths. The model combines a spectral emission line database, solar emission measure distributions, and estimates from ground‐based solar images of the fraction of the Sun covered by the various types of activity to synthesize the irradiance. Using Call K‐line images, the model can be used to estimate the irradiance from EUV line emission formed in the upper chromosphere and lower transition region. Comparisons of this new model with existing empirical models reveal both similarities and disagreements in the absolute magnitude, the amplitude of the rotational modulation, and the intermediate‐term solar cycle variability of the predicted fluxes.