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Controlled millimeter‐wave experiments and numerical simulations on the enhanced backscattering from one‐dimensional very rough surfaces
Author(s) -
Phu Phillip,
Ishimaru Akira,
Kuga Yasuo
Publication year - 1993
Publication title -
radio science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.371
H-Index - 84
eISSN - 1944-799X
pISSN - 0048-6604
DOI - 10.1029/93rs00362
Subject(s) - scattering , wavelength , computational physics , transverse plane , millimeter , optics , surface roughness , physics , surface finish , materials science , quantum mechanics , composite material , structural engineering , engineering
We present experimental results on the scattering of electromagnetic waves at millimeter‐wave frequencies from one‐dimensional very rough conducting surfaces with controlled surface roughness statistics. Very rough surfaces are defined as surfaces with rms height and correlation length of the order of a wavelength such that the rms slope is at least unity. It is expected that scattering experiments using these surfaces can provide useful insights since their statistics lie outside the range of validity of the present theories, namely, the Kirchhoff and perturbation theories. Strong backscattering enhancement at different incident angles, both in the transverse electric and transverse magnetic polarizations, are observed experimentally. Numerical calculations based on the exact integral equation method for cylindrical beam wave illumination compare favorably with the experimental results. The agreement between measurements and numerical calculations is good over a wide range of incident angles and for all scattering angles. The close agreement between the experimental results and numerical simulations indicates that this controlled experimental setup can be used to study scattering phenomena from one‐dimensional very rough surfaces with different roughness statistics as well as from two‐dimensional rough surfaces.