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Yield strength at high pressure and temperature
Author(s) -
Weidner Donald J.,
Wang Yanbin,
Vaughan Michael T.
Publication year - 1994
Publication title -
geophysical research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.007
H-Index - 273
eISSN - 1944-8007
pISSN - 0094-8276
DOI - 10.1029/93gl03549
Subject(s) - materials science , yield (engineering) , saturation (graph theory) , stress (linguistics) , high pressure , diamond anvil cell , composite material , volume (thermodynamics) , synchrotron radiation , thermodynamics , optics , physics , linguistics , philosophy , mathematics , combinatorics
Yield strength is measured at high pressure and temperature using a large volume, high pressure apparatus (SAM85) with synchrotron radiation. A macroscopic deviatoric stress is manifest as a uniform deviatoric strain that is oriented by the geometry of the pressurizing medium. Microscopic deviatoric stress is identified as the elastic broadening of diffraction lines. The deviatoric stress reaches the yield point as evidenced by the uniformity, the saturation, and the temperature dependence of the deviatoric stress. Yield strengths, which correspond to the stress saturation level at a few per cent strain, are determined for NaCl and MgO up to 8 GPa and 1200°C. The results are consistent at room temperature with previous diamond anvil studies and demonstrate the effect of pressure on yield strength. These data demonstrate the feasibility of determining high pressure, high temperature yield strengths for mantle phases.