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Transverse magnetic diffraction from tapered resistive junctions
Author(s) -
Kempel Leo C.,
Volakis John L.,
Senior Thomas B. A.
Publication year - 1993
Publication title -
radio science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.371
H-Index - 84
eISSN - 1944-799X
pISSN - 0048-6604
DOI - 10.1029/92rs02455
Subject(s) - resistive touchscreen , diffraction , transverse plane , scattering , optics , materials science , electrical resistivity and conductivity , condensed matter physics , physics , electrical engineering , structural engineering , quantum mechanics , engineering
In this paper we investigate the transverse magnetic (TM) scattering by a junction formed by two tapered resistive sheets whose resistivity increases away from the join. In particular, the exact diffraction coefficient for the junction formed by two coplanar linearly tapered resistive sheets is found by application of the Kontorovich‐Lebedev transform. In addition, a physical optics (PO) diffraction coefficient is presented for either linearly or quadratically tapered resistive junctions. All diffraction coefficients are compared to numerical results, and the validity range of the PO approximation is discussed.