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Reflection and transmission for planar‐layered anisotropic structures
Author(s) -
Audone Bruno,
Uslenghi Piergiorgio L. E.
Publication year - 1991
Publication title -
radio science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.371
H-Index - 84
eISSN - 1944-799X
pISSN - 0048-6604
DOI - 10.1029/90rs01643
Subject(s) - planar , anisotropy , reflection (computer programming) , polarization (electrochemistry) , immittance , optics , jump , materials science , permittivity , physics , dielectric , computer science , optoelectronics , electronic engineering , chemistry , computer graphics (images) , quantum mechanics , programming language , engineering
A structure is considered that consists of any number of planar layers of different thicknesses and materials, each represented by permittivity and permeability tensors with complex elements. In addition, anisotropic jump‐immittance sheets are located at the interfaces between layers. When a plane wave of arbitrary polarization is obliquely incident upon the structure, the reflection and, if appropriate, transmission coefficients are determined via a chain‐matrix algorithm. The related computer code is tested on a variety of structures.