Open AccessDetermination of local surface properties using Mars Express bistatic radar
Author(s) -
Simpson Richard A.,
Tyler G. Leonard,
Pätzold Martin,
Häusler Bernd
Publication year - 2006
Publication title -
journal of geophysical research: planets
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.67
H-Index - 298
eISSN - 2156-2202
pISSN - 0148-0227
DOI - 10.1029/2005je002580
Subject(s) - bistatic radar , specular reflection , mars exploration program , radar , geology , optics , physics , dielectric , penetration depth , remote sensing , materials science , radar imaging , optoelectronics , astronomy , computer science , telecommunications
Dual‐frequency bistatic radar experiments were conducted with Mars Express at a rate of one to two per month during 2005. Each observation provided power measurements of orthogonally polarized surface echoes at one specular point; the ratio of these components yielded values of the dielectric constant in the range 2.0 < ɛ < 4.0. Doppler sorting of X‐band (wavelength λ = 3.6 cm) echoes was used to achieve one‐dimensional surface resolutions of about 20 km. Although much weaker, simultaneous S‐band (13‐cm) echoes yielded dielectric constants that are 10–50% higher than 3.6 cm echoes, consistent with deeper surface penetration.