Background-Free Detection of Single 5 nm Nanoparticles through Interferometric Cross-Polarization Microscopy | Zendy

Xin Hong | Zendy; Erik M. P. H. van Dijk | Zendy; Simon R. Hall | Zendy; Jörg B. Götte | Zendy; N.F. van Hulst | Zendy; H. Gersen | Zendy

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Background-Free Detection of Single 5 nm Nanoparticles through Interferometric Cross-Polarization Microscopy

Author(s) -

Xin Hong,

Erik M. P. H. van Dijk,

Simon R. Hall,

Jörg B. Götte,

N.F. van Hulst,

H. Gersen

Publication year - 2011

Publication title -

nano letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 4.853

H-Index - 488

eISSN - 1530-6992

pISSN - 1530-6984

DOI - 10.1021/nl1034489

Subject(s) - nanoparticle , interferometry , polarization microscopy , microscopy , plasmon , materials science , surface plasmon resonance , polarization (electrochemistry) , nanotechnology , optical microscope , optics , optoelectronics , chemistry , scanning electron microscope , physics , composite material

Metal nanoparticles play a key role in sensing and imaging. Here we demonstrate the detection of metal particles down to 5 nm in size with a signal-to-noise ratio of ∼7 using interferometric cross-polarization microscopy at ultralow excitation powers (∼1 μW) compatible with single molecule detection. The method is background-free and induces no heating as it operates far from plasmonic resonance. The combination of unlimited observation time and protein-sized metal nanoparticles has great potential for biophysical applications.

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