Open AccessModel-Independent X-ray Reflectivity Fitting for Structure Analysis of Poly(3-hexylthiophene) Films
Author(s) -
Oliver Werzer,
Roland Resel
Publication year - 2013
Publication title -
macromolecules
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.994
H-Index - 313
eISSN - 1520-5835
pISSN - 0024-9297
DOI - 10.1021/ma400147g
Subject(s) - x ray reflectivity , lamella (surface anatomy) , thin film , crystallinity , reflectivity , materials science , polymer , layer (electronics) , optics , analytical chemistry (journal) , crystallography , chemistry , composite material , nanotechnology , physics , organic chemistry