X-ray Photoelectron Spectroscopy of Isolated Nanoparticles | Zendy

O. Sublemontier | Zendy; Christophe Nicolas | Zendy; Damien Aureau | Zendy; Minna Patanen | Zendy; Harold Kintz | Zendy; Xiao-Jing Liu | Zendy; M.A. Gaveau | Zendy; Jean-Luc Le Garrec | Zendy; Emmanuel Robert | Zendy; Flory-Anne Barreda | Zendy; Arnaud Etchéberry | Zendy; Cécile Reynaud | Zendy; James B. Mitchell | Zendy; Catalin Miron | Zendy

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X-ray Photoelectron Spectroscopy of Isolated Nanoparticles

Author(s) -

O. Sublemontier,

Christophe Nicolas,

Damien Aureau,

Minna Patanen,

Harold Kintz,

Xiao-Jing Liu,

M.A. Gaveau,

Jean-Luc Le Garrec,

Emmanuel Robert,

Flory-Anne Barreda,

Arnaud Etchéberry,

Cécile Reynaud,

James B. Mitchell,

Catalin Miron

Publication year - 2014

Publication title -

the journal of physical chemistry letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 2.563

H-Index - 203

ISSN - 1948-7185

DOI - 10.1021/jz501532c

Subject(s) - x ray photoelectron spectroscopy , substrate (aquarium) , synchrotron radiation , nanoparticle , materials science , silicon , spectroscopy , analytical chemistry (journal) , nanotechnology , optoelectronics , optics , chemistry , nuclear magnetic resonance , physics , oceanography , quantum mechanics , chromatography , geology

X-ray photoelectron spectroscopy (XPS) is a very efficient and still progressing surface analysis technique. However, when applied to nano-objects, this technique faces drawbacks due to interactions with the substrate and sample charging effects. We present a new experimental approach to XPS based on coupling soft X-ray synchrotron radiation with an in-vacuum beam of free nanoparticles, focused by an aerodynamic lens system. The structure of the Si/SiO2 interface was probed without any substrate interaction or charging effects for silicon nanocrystals previously oxidized in ambient air. Complete characterization of the surface was obtained. The Si 2p core level spectrum reveals a nonabrupt interface.

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