Cu2I2Se6: A Metal–Inorganic Framework Wide-Bandgap Semiconductor for Photon Detection at Room Temperature
Author(s) -
Wenwen Lin,
Constantinos C. Stoumpos,
Oleg Y. Kontsevoi,
Zhifu Liu,
Yihui He,
Sanjib Das,
Yadong Xu,
Kyle M. McCall,
Bruce W. Wessels,
Mercouri G. Kanatzidis
Publication year - 2018
Publication title -
journal of the american chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 7.115
H-Index - 612
eISSN - 1520-5126
pISSN - 0002-7863
DOI - 10.1021/jacs.7b12549
Subject(s) - band gap , semiconductor , chemistry , electron mobility , amorphous solid , optoelectronics , photosensitivity , direct and indirect band gaps , photon energy , electron , electrical resistivity and conductivity , wide bandgap semiconductor , x ray detector , particle detector , photon , analytical chemistry (journal) , radiation , optics , detector , materials science , crystallography , physics , nuclear physics , quantum mechanics , chromatography
Cu 2 I 2 Se 6 is a new wide-bandgap semiconductor with high stability and great potential toward hard radiation and photon detection. Cu 2 I 2 Se 6 crystallizes in the rhombohedral R3̅m space group with a density of d = 5.287 g·cm -3 and a wide bandgap E g of 1.95 eV. First-principles electronic band structure calculations at the density functional theory level indicate an indirect bandgap and a low electron effective mass m e * of 0.32. The congruently melting compound was grown in centimeter-size Cu 2 I 2 Se 6 single crystals using a vertical Bridgman method. A high electric resistivity of ∼10 12 Ω·cm is readily achieved, and detectors made of Cu 2 I 2 Se 6 single crystals demonstrate high photosensitivity to Ag Kα X-rays (22.4 keV) and show spectroscopic performance with energy resolutions under 241 Am α-particles (5.5 MeV) radiation. The electron mobility is measured by a time-of-flight technique to be ∼46 cm 2 ·V -1 ·s -1 . This value is comparable to that of one of the leading γ-ray detector materials, TlBr, and is a factor of 30 higher than mobility values obtained for amorphous Se for X-ray detection.
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