Direct Observation of Plugs and Intrawall Pores in SBA-15 Using Low Voltage High Resolution Scanning Electron Microscopy and the Influence of Solvent Properties on Plug-Formation | Zendy

Tomas Kjellman | Zendy; Shunsuke Asahina | Zendy; Julien Schmitt | Zendy; Marianne ImpérorClerc | Zendy; Osamu Terasaki | Zendy; Viveka Alfredsson | Zendy

Open Access

Direct Observation of Plugs and Intrawall Pores in SBA-15 Using Low Voltage High Resolution Scanning Electron Microscopy and the Influence of Solvent Properties on Plug-Formation

Author(s) -

Tomas Kjellman,

Shunsuke Asahina,

Julien Schmitt,

Marianne ImpérorClerc,

Osamu Terasaki,

Viveka Alfredsson

Publication year - 2013

Publication title -

chemistry of materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.741

H-Index - 375

eISSN - 1520-5002

pISSN - 0897-4756

DOI - 10.1021/cm402635m

Subject(s) - small angle x ray scattering , scanning electron microscope , mesophase , scattering , materials science , resolution (logic) , microporous material , solvent , chemical engineering , analytical chemistry (journal) , chemistry , composite material , optics , chromatography , optoelectronics , physics , liquid crystal , organic chemistry , artificial intelligence , computer science , engineering

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