TiO2–x-Enhanced IR Hot Carrier Based Photodetection in Metal Thin Film–Si Junctions
Author(s) -
Nicholas A. Güsken,
Alberto Lauri,
Yi Li,
Takayuki Matsui,
Brock Doiron,
Ryan Bower,
Anna Regoutz,
Andrei P. Mihai,
Peter K. Petrov,
Rupert F. Oulton,
L. F. Cohen,
Stefan A. Maier
Publication year - 2019
Publication title -
acs photonics
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 2.735
H-Index - 89
ISSN - 2330-4022
DOI - 10.1021/acsphotonics.8b01639
Subject(s) - photodetection , materials science , photocurrent , optoelectronics , tin , titanium nitride , amorphous solid , substrate (aquarium) , thin film , semiconductor , nitride , photodetector , nanotechnology , layer (electronics) , chemistry , oceanography , organic chemistry , geology , metallurgy
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