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Advanced Optical Characterization of PEDOT:PSS by Combining Spectroscopic Ellipsometry and Raman Scattering
Author(s) -
Minghua Kong,
M. Garriga,
J. S. Reparaz,
M. I. Alonso
Publication year - 2022
Publication title -
acs omega
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.779
H-Index - 40
ISSN - 2470-1343
DOI - 10.1021/acsomega.2c05945
Subject(s) - raman spectroscopy , materials science , ellipsometry , anisotropy , pedot:pss , raman scattering , characterization (materials science) , isotropy , optics , scattering , optoelectronics , molecular physics , thin film , chemistry , nanotechnology , polymer , composite material , physics

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