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Photoluminescence Dynamics of Aryl sp3 Defect States in Single-Walled Carbon Nanotubes
Author(s) -
Nicolai F. Hartmann,
Kirill A. Velizhanin,
Erik H. Hároz,
Mijin Kim,
Xuedan Ma,
YuHuang Wang,
Han Htoon,
Stephen K. Doorn
Publication year - 2016
Publication title -
acs nano
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.554
H-Index - 382
eISSN - 1936-086X
pISSN - 1936-0851
DOI - 10.1021/acsnano.6b02986
Subject(s) - exciton , photoluminescence , carbon nanotube , dopant , materials science , relaxation (psychology) , chemical physics , density functional theory , biexciton , nanotechnology , molecular physics , doping , chemistry , condensed matter physics , computational chemistry , optoelectronics , physics , psychology , social psychology
Photoluminescent defect states introduced by sp(3) functionalization of semiconducting carbon nanotubes are rapidly emerging as important routes for boosting emission quantum yields and introducing new functionality. Knowledge of the relaxation dynamics of these states is required for understanding how functionalizing agents (molecular dopants) may be designed to access specific behaviors. We measure photoluminescence (PL) decay dynamics of sp(3) defect states introduced by aryl functionalization of the carbon nanotube surface. Results are given for five different nanotube chiralities, each doped with a range of aryl functionality. We find that the PL decays of these sp(3) defect states are biexponential, with both components relaxing on time scales of ∼100 ps. Exciton trapping at defects is found to increases PL lifetimes by a factor of 5-10, in comparison to those for the free exciton. A significant chirality dependence is observed in the decay times, ranging from 77 ps for (7,5) nanotubes to >600 ps for (5,4) structures. The strong correlation of time constants with emission energy indicates relaxation occurs via multiphonon decay processes, with close agreement to theoretical expectations. Variation of the aryl dopant further modulates decay times by 10-15%. The aryl defects also affect PL lifetimes of the free E11 exciton. Shortening of the E11 bright state lifetime as defect density increases provides further confirmation that defects act as exciton traps. A similar shortening of the E11 dark exciton lifetime is found as defect density increases, providing strong experimental evidence that dark excitons are also trapped at such defect sites.

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