Open AccessStructural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation
Author(s) -
Tobias Vogel,
Alexander Zintler,
Nico Kaiser,
Nicolas Guillaume,
Gauthier Lefèvre,
Maximilian Lederer,
A. Serra,
Eszter Piros,
Tae-Wook Kim,
Philipp Schreyer,
Robert Eilhardt,
Déspisiou,
Ricardo Olivo,
Tarek Ali,
David Lehninger,
Alexey Arzumanov,
Christelle CharpinNicolle,
G. Bourgeois,
L. Grenouillet,
Marie-Claire Cyrille,
Gabriele Navarro,
Konrad Seidel,
Thomas Kämpfe,
Stefan Petzold,
C. Trautmann,
Leopoldo MolinaLuna,
Lambert Alff
Publication year - 2022
Publication title -
acs nano
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.554
H-Index - 382
eISSN - 1936-086X
pISSN - 1936-0851
DOI - 10.1021/acsnano.2c04841
Subject(s) - materials science , phase change memory , nanotechnology , optoelectronics , characterization (materials science) , oxide , engineering physics , physics , layer (electronics) , metallurgy