Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation
Author(s) -
Tobias Vogel,
Alexander Zintler,
Nico Kaiser,
Nicolas Guillaume,
Gauthier Lefèvre,
Maximilian Lederer,
A. Serra,
Eszter Piros,
TaeWook Kim,
Philipp Schreyer,
Robert Winkler,
Déspisiou,
Ricardo Olivo,
Tarek Ali,
David Lehninger,
Alexey Arzumanov,
C. Charpin-Nicolle,
G. Bourgeois,
L. Grenouillet,
M. C. Cyrille,
G. Navarro,
Konrad Seidel,
Thomas Kämpfe,
Stefan Petzold,
C. Trautmann,
Leopoldo MolinaLuna,
Lambert Alff
Publication year - 2022
Publication title -
acs nano
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.554
H-Index - 382
eISSN - 1936-086X
pISSN - 1936-0851
DOI - 10.1021/acsnano.2c04841
Subject(s) - materials science , phase change memory , nanotechnology , optoelectronics , characterization (materials science) , oxide , engineering physics , physics , layer (electronics) , metallurgy
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