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Edge-Contact MoS2 Transistors Fabricated Using Thermal Scanning Probe Lithography
Author(s) -
Ana CondeRubio,
Xia Liu,
Giovanni Boero,
Juergen Brügger
Publication year - 2022
Publication title -
acs applied materials and interfaces
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 2.535
H-Index - 228
eISSN - 1944-8252
pISSN - 1944-8244
DOI - 10.1021/acsami.2c10150
Subject(s) - materials science , lithography , fabrication , etching (microfabrication) , optoelectronics , nanotechnology , resist , electron beam lithography , semiconductor , enhanced data rates for gsm evolution , transistor , layer (electronics) , electrical engineering , medicine , telecommunications , alternative medicine , engineering , pathology , voltage , computer science

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