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Nanoscale Interfacial Engineering for Flexible Barrier Films
Author(s) -
Can Cai,
Reinhold H. Dauskardt
Publication year - 2015
Publication title -
nano letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.853
H-Index - 488
eISSN - 1530-6992
pISSN - 1530-6984
DOI - 10.1021/acs.nanolett.5b02597
Subject(s) - materials science , delamination (geology) , adhesion , silicon oxide , nanoscopic scale , oxide , silicon , thin film , nanotechnology , nanostructure , diffusion barrier , degradation (telecommunications) , composite material , optoelectronics , chemical engineering , layer (electronics) , electronic engineering , paleontology , silicon nitride , tectonics , engineering , subduction , metallurgy , biology
Alternating layers of organic and oxide thin films used as diffusion barriers in emerging flexible device technologies are vulnerable to degradation under the influence of mechanical stresses, temperature cycling, photodegradation, and chemically active environmental species. Delamination of the internal organic to oxide interfaces often limits the operational lifetime of the barrier system. We demonstrate a method for increasing the adhesion of organic and oxide thin films by generating nanostructures at the interface. We show that the adhesion of an acrylate to silicon oxide model system can be increased by up to an order of magnitude (from ∼2 J/m(2) to 24 J/m(2)). By altering the diameter and depth of the patterns in the model systems, the adhesion energy can be changed, and the delamination pathway can be controlled. In addition, we show that a patterned interface maintains a higher adhesion than its planar counterpart for all durations of UV-A and UV-B exposure.

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