Open AccessNanoscale Localization of an Atom Probe Tip through Electric Field Mapping
Author(s) -
Jonathan Op de Beeck,
Claudia Fleischmann,
Wilfried Vandervorst,
Kristof Paredis
Publication year - 2019
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.9b10194
Subject(s) - atom probe , scanning probe microscopy , nanoscopic scale , electric field , materials science , resolution (logic) , nanotechnology , field (mathematics) , optics , scanning ion conductance microscopy , microscopy , physics , computer science , scanning confocal electron microscopy , artificial intelligence , mathematics , quantum mechanics , transmission electron microscopy , pure mathematics
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