General Considerations for Improving Photovoltage in Metal–Insulator–Semiconductor Photoanodes
Author(s) -
Ibadillah A. Digdaya,
Bartek J. Trześniewski,
Gede W. P. Adhyaksa,
Erik C. Garnett,
Wilson A. Smith
Publication year - 2018
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.7b11747
Subject(s) - surface photovoltage , materials science , semiconductor , optoelectronics , oxide , bimetal , metal , insulator (electricity) , electrode , silicon , aluminium , nanotechnology , chemistry , composite material , metallurgy , physics , quantum mechanics , spectroscopy
Metal-insulator-semiconductor (MIS) photoelectrodes offer a simple alternative to the traditional semiconductor-liquid junction and the conventional p-n junction electrode. Highly efficient MIS photoanodes require interfacial surface passivating oxides and high workfunction metals to produce a high photovoltage. Herein, we investigate and analyze the effect of interfacial oxides and metal workfunctions on the barrier height and the photovoltage of a c-Si photoanode. We use two metal components in a bimetal contact configuration and observe the modulation of the effective barrier height and the resulting photovoltage as a function of the secondary outer metal. The photovoltage shows a strong linear dependence by increasing the inner metal workfunction, with the highest photovoltage achieved by a MIS photoanode using a platinum inner metal. We also found that coupling a thin aluminium oxide with an interfacial silicon oxide and controlling the oxide thickness can significantly improve the photovoltage of an MIS junction photoanode.
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