Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy | Zendy

Ebrahim Ghanbari | Zendy; Thorsten Wagner | Zendy; P. Zeppenfeld | Zendy

Open Access

Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy

Author(s) -

Ebrahim Ghanbari,

Thorsten Wagner,

P. Zeppenfeld

Publication year - 2015

Publication title -

the journal of physical chemistry c

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.401

H-Index - 289

eISSN - 1932-7455

pISSN - 1932-7447

DOI - 10.1021/acs.jpcc.5b08083

Subject(s) - x ray photoelectron spectroscopy , monolayer , thin film , materials science , microscopy , optical microscope , spectroscopy , deposition (geology) , optoelectronics , analytical chemistry (journal) , optics , nanotechnology , chemistry , chemical engineering , scanning electron microscope , organic chemistry , physics , paleontology , quantum mechanics , sediment , engineering , composite material , biology

Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which both techniques have been applied simultaneously and synchronously. We illustrate how the combined PEEM and DRS results can be correlated to obtain an extended perspective on the electronic and optical properties of a molecular film dependent on the film thickness and morphology. As an example, we studied the deposition of the organic molecule α-sexithiophene on Ag(111) in the thickness range from submonolayers up to several monolayers.

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