Open AccessElectrical Characteristics of a Carbon Nanotube-Functionalized Probe for Kelvin Probe Force Microscopy
Author(s) -
Xin Li,
Xiao Hu,
Mengxi Liu,
Lianfeng Sun,
Xiaohui Qiu
Publication year - 2020
Publication title -
the journal of physical chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.401
H-Index - 289
eISSN - 1932-7455
pISSN - 1932-7447
DOI - 10.1021/acs.jpcc.0c08640
Subject(s) - kelvin probe force microscope , carbon nanotube , volta potential , scanning probe microscopy , materials science , dipole , electrostatic force microscope , work function , nanotechnology , microscopy , radius , conductive atomic force microscopy , molecular physics , optics , chemistry , atomic force microscopy , physics , computer security , organic chemistry , layer (electronics) , computer science
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