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Using Ion Imaging to Measure Velocity Distributions in Surface Scattering Experiments
Author(s) -
Dan J. Harding,
Jannis Neugebohren,
Daniel J. Auerbach,
Theofanis N. Kitsopoulos,
Alec M. Wodtke
Publication year - 2015
Publication title -
the journal of physical chemistry a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.756
H-Index - 235
eISSN - 1520-5215
pISSN - 1089-5639
DOI - 10.1021/acs.jpca.5b06272
Subject(s) - scattering , optics , image resolution , angular resolution (graph drawing) , slicing , ion , plane (geometry) , image plane , surface (topology) , resolution (logic) , temporal resolution , physics , measure (data warehouse) , materials science , computational physics , image (mathematics) , computer science , mathematics , geometry , artificial intelligence , combinatorics , database , quantum mechanics , world wide web
We present a new implementation of ion imaging for the study of surface scattering processes. The technique uses a combination of spatial ion imaging with laser slicing and delayed pulsed extraction. The scattering velocities of interest are parallel to the imaging plane, allowing speed and angular distributions to be extracted from a single image. The first results of direct scattering of N2 from a clean, single-crystal Au(111) surface are reported, and the speed resolution is shown to be competitive with current state-of-the-art time-of-flight methods for velocity measurements while providing simultaneous measurements of in-plane angular distributions.

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