Open AccessPattern Matching and Active Simulation Method for Process Fault Diagnosis
Author(s) -
Weijun Li,
Sai Gu,
Xiangping Zhang,
Tao Chen
Publication year - 2020
Publication title -
industrial and engineering chemistry research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.878
H-Index - 221
eISSN - 1520-5045
pISSN - 0888-5885
DOI - 10.1021/acs.iecr.0c02424
Subject(s) - benchmark (surveying) , fault (geology) , computer science , process (computing) , matching (statistics) , fault detection and isolation , exploit , data mining , pattern recognition (psychology) , algorithm , artificial intelligence , mathematics , statistics , geodesy , seismology , geography , actuator , geology , operating system , computer security
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