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Elucidating the Evolving Atomic Structure in Atomic Layer Deposition Reactions with in Situ XANES and Machine Learning
Author(s) -
Orlando Trejo,
Anup L. Dadlani,
Francisco De La Paz,
Shinjita Acharya,
Rob Kravec,
Dennis Nordlund,
Ritimukta Sarangi,
Fritz B. Prinz,
Jan Torgersen,
Neil P. Dasgupta
Publication year - 2019
Publication title -
chemistry of materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.741
H-Index - 375
eISSN - 1520-5002
pISSN - 0897-4756
DOI - 10.1021/acs.chemmater.9b03025
Subject(s) - xanes , atomic layer deposition , nucleation , thin film , atomic units , materials science , in situ , deposition (geology) , nanoparticle , nanotechnology , characterization (materials science) , layer (electronics) , absorption (acoustics) , synchrotron , phase (matter) , spectral line , chemistry , optics , physics , paleontology , organic chemistry , quantum mechanics , astronomy , sediment , composite material , biology

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