Imaging Excited-State Dynamics in Two-Dimensional Semiconductors with Emerging Ultrafast Measurement Techniques
Author(s) -
Joshua Reding,
Wei Zhang,
J. Allam
Publication year - 2021
Publication title -
accounts of materials research
Language(s) - English
Resource type - Journals
ISSN - 2643-6728
DOI - 10.1021/accountsmr.0c00064
Subject(s) - trion , exciton , materials science , semiconductor , excited state , femtosecond , condensed matter physics , monolayer , auger effect , chemical physics , physics , optoelectronics , nanotechnology , atomic physics , auger , laser , optics
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