Open AccessCertification of SRM 640f line position and line shape standard for powder diffraction
Author(s) -
David R. Black,
Marcus H. Mendenhall,
Albert Henins,
James J. Filliben,
James P. Cline
Publication year - 2020
Publication title -
powder diffraction
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.34
H-Index - 43
eISSN - 1945-7413
pISSN - 0885-7156
DOI - 10.1017/s0885715620000366
Subject(s) - nist , powder diffractometer , diffractometer , powder diffraction , materials science , lattice constant , certification , diffraction , neutron diffraction , lattice (music) , analytical chemistry (journal) , crystallography , computer science , optics , composite material , physics , chromatography , chemistry , acoustics , scanning electron microscope , natural language processing , political science , law
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 640f, the seventh generation of this powder diffraction SRM, which is designed to be used primarily for calibrating powder diffractometers with respect to line position; it also can be used for the determination of the instrument profile function. It is certified with respect to the lattice parameter and consists of approximately 7.5 g of silicon powder prepared to minimize line broadening. A NIST-built diffractometer, incorporating many advanced design features, was used to certify the lattice parameter of the Si powder. Both statistical and systematic uncertainties have been assigned to yield a certified value for the lattice parameter at 22.5 °C of a = 0.5431144 ± 0.8 nm.