Application of HVEM to the Study of Radiation Damage in Metals
Author(s) -
J.J. Laidler,
B. Mastel
Publication year - 1973
Publication title -
proceedings annual meeting electron microscopy society of america
Language(s) - English
Resource type - Journals
eISSN - 2690-1315
pISSN - 0424-8201
DOI - 10.1017/s0424820100070497
Subject(s) - radiation damage , irradiation , limiting , crystallographic defect , materials science , radiation , voltage , electron microscope , nanotechnology , optics , chemistry , physics , mechanical engineering , crystallography , electrical engineering , nuclear physics , engineering
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