
Reliability and validity of WAIS-R short forms in schizophrenia Huegel, S. G., Allen, D. N., van Kammen, D. P., Kelley, M. E., & Gurklis Jr., J. A.
Publication year - 1997
Publication title -
archives of clinical neuropsychology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.909
H-Index - 98
eISSN - 1873-5843
pISSN - 0887-6177
DOI - 10.1016/s0887-6177(97)83556-1
Subject(s) - psychology , wechsler adult intelligence scale , reliability (semiconductor) , schizophrenia (object oriented programming) , psychiatry , physics , thermodynamics , cognition , power (physics)