Open AccessMathematical modeling of point defect cluster formation in silicon based on molecular dynamic approach
Author(s) -
K. K. Abgaryan,
O. Volodina,
С. И. Уваров
Publication year - 2015
Publication title -
modern electronic materials
Language(s) - English
Resource type - Journals
eISSN - 2452-2449
pISSN - 2452-1779
DOI - 10.1016/j.moem.2016.03.001
Subject(s) - silicon , crystallographic defect , cluster (spacecraft) , parametric statistics , materials science , point (geometry) , basis (linear algebra) , statistical physics , molecular dynamics , density functional theory , computational physics , chemical physics , computer science , computational chemistry , crystallography , chemistry , physics , optoelectronics , geometry , statistics , mathematics , programming language
A very important task on the way of improving the technologies of synthesizing highly effective light-emitting diodes on the basis of silicon is theoretical research into the formation of point defect clusters. One method of obtaining silicon with photoluminescent properties is radiation impact. It causes the formation of various defects in its structure, including point and linear defects, their clusters and complexes. In this paper a mathematical model was used to determine the coordinates and velocities of all particles in the system. The model was used for describing point defect formation processes and studying their evolution with time and temperature. The multi-parametrical Tersoff potential was used for the description of interactions between particles. The values of the Tersoff potential were selected by solving the parametric identification problem for silicon. For developing the models we used the system cohesive energy values obtained by an ab initio calculation based on the density functional theory (DFT). The resultant computer model allows MD simulation of silicon crystal structure with point defects and their cluster with possible visualization and animation of simulation results