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Ultrastable atomic force microscopy: Improved force and positional stability
Author(s) -
Churnside Allison B.,
Perkins Thomas T.
Publication year - 2014
Publication title -
febs letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.593
H-Index - 257
eISSN - 1873-3468
pISSN - 0014-5793
DOI - 10.1016/j.febslet.2014.04.033
Subject(s) - cantilever , atomic force microscopy , nanotechnology , materials science , microscopy , laser , coating , instrumentation (computer programming) , force spectroscopy , optics , optoelectronics , physics , computer science , composite material , operating system
Atomic force microscopy (AFM) is an exciting technique for biophysical studies of single molecules, but its usefulness is limited by instrumental drift. We dramatically reduced positional drift by adding two lasers to track and thereby actively stabilize the tip and the surface. These lasers also enabled label‐free optical images that were spatially aligned to the tip position. Finally, sub‐pN force stability over 100 s was achieved by removing the gold coating from soft cantilevers. These enhancements to AFM instrumentation can immediately benefit research in biophysics and nanoscience.