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Ultra‐high resolution imaging of DNA and nucleosomes using non‐contact atomic force microscopy
Author(s) -
Davies Emma,
Teng Kar Seng,
Conlan Robert Steven,
Wilks Stephen Patrick
Publication year - 2005
Publication title -
febs letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.593
H-Index - 257
eISSN - 1873-3468
pISSN - 0014-5793
DOI - 10.1016/j.febslet.2005.02.028
Subject(s) - mica , biomolecule , nanotechnology , atomic force microscopy , microscopy , resolution (logic) , materials science , nanobiotechnology , cryo electron microscopy , nanoscopic scale , chemistry , nanoparticle , optics , physics , biochemistry , artificial intelligence , computer science , composite material
Visualisation of nano‐scale biomolecules aids understanding and development in molecular biology and nanotechnology. Detailed structure of nucleosomes adsorbed to mica has been captured in the absence of chemical‐anchoring techniques, demonstrating the usefulness of non‐contact atomic force microscopy (NC‐AFM) for ultra‐high resolution biomolecular imaging. NC‐AFM offers significant advantages in terms of resolution, speed and ease of sample preparation when compared to techniques such as cryo‐electron microscopy and X‐ray crystallography. In the absence of chemical modification, detailed structure of DNA deposited on a gold substrate was observed for the first time using NC‐AFM, opening up possibilities for investigating the electrical properties of unmodified DNA.