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High sensitivity detection of protein molecules picked up on a probe of atomic force microscope based on the fluorescence detection by a total internal reflection fluorescence microscope
Author(s) -
Yamada Takafumi,
Afrin Rehana,
Arakawa Hideo,
Ikai Atsushi
Publication year - 2004
Publication title -
febs letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.593
H-Index - 257
eISSN - 1873-3468
pISSN - 0014-5793
DOI - 10.1016/j.febslet.2004.05.049
Subject(s) - total internal reflection fluorescence microscope , microscope , fluorescence microscope , fluorescence , microscopy , chemistry , analytical chemistry (journal) , atomic force microscopy , reflection (computer programming) , materials science , optics , nanotechnology , chromatography , physics , computer science , programming language
We developed a method to detect and identify proteins on a probe of the atomic force microscope (AFM) with a high sensitivity. Due to a low background noise of the total internal reflection fluorescence microscope employed as a detecting system, we were able to achieve a high enough sensitivity to detect zeptomole orders of protein molecules immobilized on the tip. Several different methods to immobilize protein molecules to AFM‐probes were tested, meant for a wide range of applications of this method. Furthermore, we demonstrated that different proteins were clearly distinguished by immunofluorescence microscopy on the probe using their specific antibodies.