Premium
14 N and 15 N imaging by SIMS microscopy in soybean leaves
Author(s) -
Grig Nicole,
Halpern Sylvain,
Gojon Alain,
Fragu Philippe
Publication year - 1992
Publication title -
biology of the cell
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.543
H-Index - 85
eISSN - 1768-322X
pISSN - 0248-4900
DOI - 10.1016/0248-4900(92)90020-2
Subject(s) - glycine , microscopy , resolution (logic) , biology , ion , nitrogen , ionic bonding , secondary ion mass spectrometry , analytical chemistry (journal) , cluster (spacecraft) , crystallography , amino acid , chemistry , chromatography , biochemistry , physics , optics , organic chemistry , artificial intelligence , computer science , programming language
Summary— The distribution of 15 N and 14 N compounds in cryofixed and resin embedded sections of soybean ( Glycine max L) leaves was studied by SIMS microscopy. The results indicate that, with a mass resolution M /Δ M higher than 6000, images of the nitrogen distribution can be obtained from the mapping of the two secondary cluster ions 12 C 14 N − and 12 C 15 N − , in samples of both control and 15 N‐labeled leaves. The ionic images were clearly related to the histological structure of the organ, and allow the detection of 14 N and 15 N at the subcellular level. Furthermore, relative measurements of the 12 C 14 N − and 12 C 15 N − beams made possible the quantification of the 15 N atom% in the various tissues of the leaf.