Open AccessMicrostructure and Optical Properties of Ti54.5Ni45.5 Nanocrystalline Thin Film
Author(s) -
Xin Zhang,
Jiehe Sui,
Yongchao Lei,
Wei Cai
Publication year - 2017
Publication title -
acta metallurgica sinica (english letters)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.594
H-Index - 33
eISSN - 2194-1289
pISSN - 1006-7191
DOI - 10.1007/s40195-017-0606-3
Subject(s) - materials science , nanocrystalline material , microstructure , substructure , sputter deposition , thin film , annealing (glass) , martensite , wavelength , reflectivity , sputtering , optics , composite material , optoelectronics , metallurgy , nanotechnology , physics , structural engineering , engineering
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