Preparation and characterization of Bi2S3 compound semiconductor
Author(s) -
M. P. Deshpande,
Pallavi Sakariya,
Sandip V. Bhatt,
Nikita H. Patel,
K.D. Patel,
Sunil H. Chaki
Publication year - 2015
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/s12034-014-0830-7
Subject(s) - materials science , orthorhombic crystal system , raman spectroscopy , scanning electron microscope , analytical chemistry (journal) , seebeck coefficient , single crystal , electrical resistivity and conductivity , stoichiometry , powder diffraction , lattice constant , crystal structure , crystallography , thermal conductivity , diffraction , optics , chemistry , composite material , physics , electrical engineering , chromatography , engineering
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