Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4 | Zendy

Yun Xue | Zendy; S. Naher | Zendy; Fumiaki Hata | Zendy; Hiroshi Kaneko | Zendy; Haruhiko Suzuki | Zendy; Yoshihiro Kino | Zendy

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Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4

Author(s) -

Yun Xue,

S. Naher,

Fumiaki Hata,

Hiroshi Kaneko,

Haruhiko Suzuki,

Yoshihiro Kino

Publication year - 2008

Publication title -

journal of low temperature physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.598

H-Index - 67

eISSN - 1573-7357

pISSN - 0022-2291

DOI - 10.1007/s10909-008-9796-4

Subject(s) - diffraction , materials science , full width at half maximum , x ray crystallography , softening , x ray , spectral line , intensity (physics) , optics , physics , composite material , optoelectronics , astronomy

Results of x-ray diffraction measurements are presented for ZnCr2O4 and Ni0.5Zn0.5Cr2O4. Splits of the x-ray diffraction spectrum are observed in ZnCr2O4 at 12 K. In Ni0.5Zn0.5Cr2O4 no clear split is observed, but a full width at half maximum (FWHM) shows a steep increase below about 20 K. It is found that the integrated intensity of the diffraction spectra shows a softening behavior at low temperatures in ZnCr2O4. © 2008 Springer Science+Business Media, LLC

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