X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement | Zendy

Farley Chicilo | Zendy; Cyril Koughia | Zendy; Richard J. Curry | Zendy; R. Gwilliam | Zendy; Ruben AhumadaLazo | Zendy; Andy Edgar | Zendy; David J. Binks | Zendy; Dean Chapman | Zendy; Safa Kasap | Zendy

Open Access

X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement

Author(s) -

Farley Chicilo,

Cyril Koughia,

Richard J. Curry,

R. Gwilliam,

Ruben AhumadaLazo,

Andy Edgar,

David J. Binks,

Dean Chapman,

Safa Kasap

Publication year - 2019

Publication title -

journal of materials science materials in electronics

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 0.489

H-Index - 75

eISSN - 1573-482X

pISSN - 0957-4522

DOI - 10.1007/s10854-019-01212-4

Subject(s) - ion , materials science , irradiation , photoluminescence , microbeam , analytical chemistry (journal) , ion implantation , annealing (glass) , samarium , spectroscopy , valence (chemistry) , amorphous solid , optoelectronics , chemistry , optics , crystallography , physics , inorganic chemistry , organic chemistry , chromatography , quantum mechanics , nuclear physics , composite material

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