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Microstructural evolution of ion-irradiated sol–gel-derived thin films
Author(s) -
S.A. Shojaee,
Y. Qi,
Yongqiang Wang,
A. Mehner,
D.A. Lucca
Publication year - 2017
Publication title -
journal of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.813
H-Index - 177
eISSN - 1573-4803
pISSN - 0022-2461
DOI - 10.1007/s10853-017-1386-x
Subject(s) - elastic recoil detection , materials science , amorphous solid , irradiation , raman spectroscopy , x ray photoelectron spectroscopy , amorphous carbon , microstructure , rutherford backscattering spectrometry , fluence , carbon fibers , analytical chemistry (journal) , carbon film , thin film , ion , chemical engineering , crystallography , composite material , nanotechnology , optics , organic chemistry , chemistry , composite number , physics , engineering , nuclear physics

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