Open AccessEvaluation of size influence on performance figures of a single photon avalanche diode fabricated in a 180 nm standard CMOS technology
Author(s) -
Imane Malass,
Wilfried Uhring,
Jean-Pierre Le Normand,
Norbert Dumas,
Foudil Dadouche
Publication year - 2016
Publication title -
analog integrated circuits and signal processing
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.24
H-Index - 49
eISSN - 1573-1979
pISSN - 0925-1030
DOI - 10.1007/s10470-016-0763-8
Subject(s) - photodetection , cmos , avalanche diode , materials science , avalanche photodiode , single photon avalanche diode , diode , optoelectronics , optics , detector , photon counting , resolution (logic) , full width at half maximum , photodetector , physics , voltage , computer science , breakdown voltage , quantum mechanics , artificial intelligence
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