Open AccessBand gap and structural parameter variation of CuInSe2(1-x)S2x solid-solution in the form of thin films
Author(s) -
Y. D. Tembhurkar,
J P Hirde
Publication year - 1992
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02927439
Subject(s) - chalcopyrite , diffractometer , materials science , tetragonal crystal system , band gap , transmittance , thin film , solid solution , analytical chemistry (journal) , lattice constant , optics , crystallography , crystal structure , diffraction , nanotechnology , optoelectronics , metallurgy , composite material , chemistry , chromatography , copper , scanning electron microscope , physics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom