Open AccessMeasurements of reflection coefficients of stratified layers using X-band bistatic scatterometers
Author(s) -
Kaushal Kumar Jha,
K. P. Singh,
R. N. Singh
Publication year - 1984
Publication title -
journal of earth system science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.444
H-Index - 52
eISSN - 0973-774X
pISSN - 0253-4126
DOI - 10.1007/bf02871991
Subject(s) - emissivity , scatterometer , reflectivity , bistatic radar , remote sensing , stratification (seeds) , microwave , brightness temperature , brightness , geology , reflection (computer programming) , optics , physics , meteorology , radar , radar imaging , wind speed , seed dormancy , telecommunications , germination , botany , quantum mechanics , dormancy , computer science , biology , programming language
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