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Evidence for selective resputtering as the growth mechanism of pair-order anisotropy in amorphous TbFe films
Author(s) -
Vincent G. Harris,
Taras Pokhil
Publication year - 1999
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02749962
Subject(s) - materials science , anisotropy , amorphous solid , condensed matter physics , atom (system on chip) , sputtering , polarization (electrochemistry) , magnetic anisotropy , sputter deposition , thin film , crystallography , optics , magnetic field , nanotechnology , physics , chemistry , magnetization , quantum mechanics , computer science , embedded system

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