Electron microscopy study of striation contrast in Al-Cu-Co-Si decagonal quasicrystals
Author(s) -
N.K. Mukhopadhyay,
G. V. S. Sastry,
G. C. Weatherly
Publication year - 1999
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02749958
Subject(s) - striation , transmission electron microscopy , quasicrystal , materials science , superstructure , diffraction , superlattice , electron diffraction , dark field microscopy , crystallography , electron microscope , phase (matter) , condensed matter physics , optics , streaking , microscopy , molecular physics , chemistry , physics , optoelectronics , nanotechnology , organic chemistry , composite material , thermodynamics
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