Vacancy-induced electronic states in substoichiometric V2 −x Mo x O3 ±y thin films and powders—A soft X-ray emission study
Author(s) -
B. S. Acharya,
Rajeev Rajeev,
L. D. Pradhan,
B.B. Nayak,
Pushparani Mishra
Publication year - 1999
Publication title -
bulletin of materials science
Language(s) - Slovenian
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02745690
Subject(s) - materials science , thin film , vanadium , molybdenum , emission spectrum , spectral line , fermi level , analytical chemistry (journal) , vanadium oxide , lattice constant , vacancy defect , condensed matter physics , nanotechnology , metallurgy , optics , electron , chemistry , physics , chromatography , quantum mechanics , astronomy , diffraction
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