Open AccessTransmission electron microscopy and X-ray diffraction studies of quantum wells
Author(s) -
D.V. Sridhara Rao,
K. Muraleedharan,
G.K. Dey,
S. K. Halder,
G. Bhagavannarayan,
P. Banerji,
Debjit Pal,
D. N. Bose
Publication year - 1999
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02745684
Subject(s) - materials science , transmission electron microscopy , epitaxy , high resolution transmission electron microscopy , quantum well , photoluminescence , metalorganic vapour phase epitaxy , analytical chemistry (journal) , diffraction , electron diffraction , secondary ion mass spectrometry , barrier layer , layer (electronics) , ion , optics , optoelectronics , nanotechnology , chemistry , laser , physics , organic chemistry , chromatography
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