Microstructural features of Cd0·8Zn0·2Te thin films studied by X-ray diffraction and electron microscopy | Zendy

B. Samanta | Zendy; Umapada Pal | Zendy; B. K. Samantaray | Zendy; Tubai Ghosh | Zendy; S. L. Sharma | Zendy; A. K. Chaudhuri | Zendy

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Microstructural features of Cd0·8Zn0·2Te thin films studied by X-ray diffraction and electron microscopy

Author(s) -

B. Samanta,

Umapada Pal,

B. K. Samantaray,

Tubai Ghosh,

S. L. Sharma,

A. K. Chaudhuri

Publication year - 1995

Publication title -

bulletin of materials science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.35

H-Index - 72

eISSN - 0973-7669

pISSN - 0250-4707

DOI - 10.1007/bf02745273

Subject(s) - materials science , crystallite , substrate (aquarium) , stacking fault , scanning electron microscope , x ray photoelectron spectroscopy , diffraction , thin film , stacking , dislocation , composite material , microstructure , stacking fault energy , crystallography , analytical chemistry (journal) , optics , chemical engineering , nanotechnology , metallurgy , nuclear magnetic resonance , geology , oceanography , physics , chemistry , engineering , chromatography

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