Open AccessDetection of surface lattice defects using line scan method
Author(s) -
M V Hanumantha Rao,
B. K. Mathur,
K. L. Chopra
Publication year - 1996
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02744678
Subject(s) - materials science , scanning tunneling microscope , lattice (music) , crystallographic defect , atom (system on chip) , lattice constant , graphite , crystal structure , condensed matter physics , crystallography , molecular physics , optics , nanotechnology , diffraction , physics , composite material , chemistry , computer science , acoustics , embedded system
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom