Electron microscopy study of chemically deposited Ni-P films
Author(s) -
Sadhna Tyagi,
V.K. Tandon,
S. Ray
Publication year - 1986
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02744158
Subject(s) - microcrystalline , materials science , amorphous solid , nucleation , microstructure , thin film , diffraction , crystallography , electron microscope , scanning electron microscope , chemical engineering , analytical chemistry (journal) , nanotechnology , optics , metallurgy , composite material , organic chemistry , chemistry , physics , engineering
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