X-ray line profile analysis of silver base Ag-Cd-In alloys
Author(s) -
S. Venkat Reddy,
S. V. Suryanarayana
Publication year - 1986
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/bf02744098
Subject(s) - materials science , indium , ternary operation , base metal , alloy , diffraction , dislocation , base (topology) , deformation (meteorology) , cadmium , metallurgy , analytical chemistry (journal) , line (geometry) , asymmetry , composite material , optics , geometry , physics , mathematical analysis , chemistry , mathematics , chromatography , welding , computer science , programming language , quantum mechanics
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