Scanning transmission electron microscopy and microdiffraction techniques | Zendy

J. M. Cowley | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Scanning transmission electron microscopy and microdiffraction techniques

Author(s) -

J. M. Cowley

Publication year - 1984

Publication title -

bulletin of materials science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.35

H-Index - 72

eISSN - 0973-7669

pISSN - 0250-4707

DOI - 10.1007/bf02744078

Subject(s) - materials science , scanning transmission electron microscopy , diffraction , dark field microscopy , electron diffraction , transmission electron microscopy , crystallite , resolution (logic) , optics , microanalysis , energy filtered transmission electron microscopy , high resolution transmission electron microscopy , selected area diffraction , microscopy , electron backscatter diffraction , energy dispersive x ray spectroscopy , scanning electron microscope , nanotechnology , physics , chemistry , organic chemistry , artificial intelligence , computer science , metallurgy , composite material

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research